The Development of the First IC Tester-per-Pin ATE system

Time Period :1980'sRelevant Date :1983-01-02

Summary : Megatest's MegaOne was the system that sparked the tester-per-pin revolution (1983, courtesy of Teradyne). Find out more in this video that contains great clips of the state-of-the-art in technology development in the early 1980's. The concepts behind it were as important to testing as the jet engine was to aviation.

A History Timeline of A ...

15 Jun 2006

A special presentation of The Chip History Center on History Timeline of Automatic Test Equipment ... See more

Evaluation of Automated ...

Jerry Hutcheson, VLSI Research's founder, was very active in the test side of the semiconductor business in the early 70's. The following document is his internal notes about tester evaluation, selection criter ... See more

SRC 25th Anniversary

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The history and accomplishments of the Semiconductor Research Corporation ... See more

Evolution of the IT Ind ...

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Evolution of the IT Industry from 1890 to 1994 ... See more

Silicon and the Microel ...

The emergence of crystalline silicon and silicon-based material such as silicon-germanium as the premier material and the personnel driving the integrated circuit (IC) microelectronics revolution will be review ... See more

Semiconductor ATE

Automatic Test Systems (ATS) encompass a broad range of equipment-in size and in function as well as in price. It includes all equipment that is used to electrically verify a device's functionality. VLSI Resear ... See more

Semiconductor Bonding & ...

Bonding and inspection has historically been overlooked by upper management in semiconductor companies. Their attention has been drawn by the enormous capital requirements of wafer fabrication. However, this ... See more

Equipment Suppliers - 1 ...

This section examines the vendors who supply semiconductor manufacturing equipment. There are approximately 534 of them. The top five are shown below in Figure 2.0.0-1. In 1989, these five companies held a 26 ... See more

Other Equipment - Devel ...

Section 4.8 covers that equipment which does not fit in the other wafer fabrication equipment categories. VLSI Research now includes two new segments under the Other Equipment classification. These segments are ... See more

Process Diagnostics - D ...

Process diagnostic equipment is critical to semiconductor manufacture. Though this equipment is not used to directly manufacture devices, it serves to verify consistent and in-control manufacturing processes. ... See more