Summary : Anelva - MBE 831 Molecular Beam Epitaxy System :1985-89
Teradyne - J973 VLSI Test System
Canon - Various models of Mask Aligners :1980-84 - The only company to offer all ...
Tetsuo (Tom) Tsuneishi for providing the strategic vision behind Tokyo Electronâ ...
Possibly the 1st high speed, high pin count, LSI Test System.
A pinnacle technically, it was also the end of the road for projection aligners.
Important events and trends were in 1997 for the semiconductor industry
Watch circuit test system 193A
Applied Materials - Silox Model AMS 2600 & 2660 :1960s - An early tool for low t ...
Dual Chamber Photostabilizer
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