Andrew S. Grove addresses the evolution of semiconductor manufacturing from the ...
Inside Intel’s Microprocessor’s covers a pictorial and spec history from the ...
Possibly the 1st high speed, high pin count, LSI Test System.
Craig Barrett, Chairman of Intel, describes why America is losing its edge and w ...
The time was the early eighties. Change for semiconductor equipment was in the a ...
If this photo looks a bit ghostly that’s because it is. We have no surviving p ...
MX-17 LSI Test System by Adar Associates, Inc...
Applied Materials - SPCVD-4000 :1960s - An LPCVD tool from a time when Applied c ...
Applied Materials - Nitrox AMN-710 :1960s - Improved yields by sealing oxide pin ...
ASM/Lawton - Encapsulation Press :1970s - Helped make all those plastic DIP pack ...
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