Teradyne - J973 VLSI Test System
KULICKE & SOFFA - 50th Anniversary
Possibly the 1st high speed, high pin count, LSI Test System.
The first commercial American X-ray lithography system.
Introducing Micrascan III+ for Critical Level Lithography
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In 1998, IBM and Novellus caught the world off-guard when they announced they we ...
A 6th gen maskless litho tool from the early 80's.
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