A History Timeline of Automatic Test Equipment

02 Jan 1983

Megatest's MegaOne was the system that sparked the tester-per-pin revolution (19 ...

Jerry Hutcheson, VLSI Research's founder, was very active in the test side of th ...

15 Feb 1995

When Back End of the Line wafer processing was new and emergent.

IC Timeline a special presentation of The Chip History Center.

Dicing equipment is used to cut apart individual die on a wafer. Typically, a di ...

Wafer fabrication equipment consists of all those types of equipment used in mak ...

12 Jun 1996

A revolution is occurring in the chip industry causing fundamental change at its ...

Key images drawn from donated and archived documents in VLSI's library. These im ...

Bonding and inspection has historically been overlooked by upper management in s ...

Ion implanters directly inject dopant atoms into semiconductor wafers. A gas con ...