Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video
Paul Magliocco discusses NexTest's Position on Open Architecture for testing sem ...
Dan Maydan talks about the early days of turning Applied Materials into a techno ...
Mark Jagiela, President of Teradyne's Semiconductor ATE Group, on the question o ...
Dick Deininger on Advanced Process Control
Semiconductor Test Consortium (STC) Panel 2008: Q & A
Semiconductor Test Consortium (STC) Panel 2008: Bob Helsel, Bode Enterprises
Jerry Cutini: President & CEO of Aviza Technology: The Opportunity for Mid-Tier ...
Edmund Cheng: VP of Marketing, Synopsys: Design-For-Manufacturing (DFM)
Boris Lipkin: President & CEO of Therma-Wave: Managing a Turnaround in an Unfrie ...
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