Summary : Structural vs Functional Test: Which is better?
Annexure :
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video
Paul Magliocco discusses NexTest's Position on Open Architecture for testing sem ...
Lithography Panel 2008: Andrew Hazelton, Nikon
Eaton's Semiconductor Foray, a case study. It was supposed to be the semiconduct ...
Mark Jagiela, President of Teradyne's Semiconductor ATE Group, on the question o ...
Yan Borodovsky discusses DFM and Computational Lithography at Intel in historic ...
Dick Deininger on Advanced Process Control
Gary Patton: VP, Semiconductor Research and Development Center, IBM: IBM’s 32n ...
Nick Konidaris: President & CEO of Electro Scientific Industries, Inc.: New Syst ...
Test Panel: Audience Q&A on... Open Architecture
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