Summary : Structural vs Functional Test: Which is better?
Annexure :
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Semiconductor History 2003: a historic video with Paul Magliocco, where he discusses the role for both Structural and Functional Test methods in ATE.
Paul Magliocco’s vision for ATE and Nextest in this historic 2003 video
Paul Magliocco discusses NexTest's Position on Open Architecture for testing sem ...
Craig Barrett, Chairman of Intel, describes why America is losing its edge and w ...
G. Dan Hutcheson: CEO of VLSI Research Inc: The Shifting Winds of Power
Semiconductor Test Consortium (STC) Panel 2008: Q & A
Semiconductor Test Consortium (STC) Panel 2008: Bob Helsel, Bode Enterprises
Lithography Panel 2007: Audience Q&A
Ken Schroeder on Process Control in this 2004 interview
Mike Splinter: President & CEO of Applied Materials: What's New at Applied Mater ...
Jerry Cutini: President & CEO of Aviza Technology: The Opportunity for Mid-Tier ...
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