| Aart de Geus |
The History of EDA: an interview with Aart de Geus |
08 Nov 2006 |
31 Aug 2017 |
| Aart de Geus |
Current Trends in EDA |
05 Dec 2006 |
21 Aug 2017 |
| Alex d'Arbeloff |
Alex d'Arbeloff on Teradyne's Early Days |
23 May 2006 |
12 Feb 2018 |
| Alex d'Arbeloff |
Alex d'Arbeloff on Teradyne's Rise |
01 Jun 2006 |
12 Feb 2018 |
| Alex d'Arbeloff |
Alex d'Arbeloff on Lessons Learned at Teradyne |
07 Jun 2006 |
12 Feb 2018 |
| Anantha Sethuraman |
Introducing DFMSim |
01 Jul 2008 |
14 Feb 2018 |
| Andre Auberton-Herve |
Soitec's SOI Roadmap |
26 Feb 2004 |
29 Aug 2017 |
| Andrew Hazelton |
Lithography Panel 2008: Andrew Hazelton, Nikon |
18 Nov 2008 |
20 Feb 2018 |
| Andrew Hazelton, Phil Ware ... |
Lithography Panel 2008: Audience Q&A |
18 Nov 2008 |
20 Feb 2018 |
| Andy Grove |
Andy Grove on the development of R&D |
15 Jun 2004 |
31 Jul 2017 |
| Andy Grove |
Andy Grove on the Evolution of Semiconductor Manufacturing |
22 Mar 2005 |
31 Jul 2017 |
| Andy Grove |
Andy Grove as an Industry Change Agent |
21 Mar 2016 |
04 Aug 2018 |
| Art Zafiropoulo |
Art Zafiropoulo and his 2000 award for Sales |
29 Nov 2004 |
21 Oct 2019 |
| Art Zafiropoulo |
Ultratech's Vision of the Future |
16 Nov 2004 |
29 Aug 2017 |
| Art Zafiropoulo |
How Organic Growth Beats Acquisitive Growth in Hi-Tech |
10 Aug 2007 |
13 Feb 2018 |
| Arthur del Prado |
A tribute to Arthur del Prado |
28 Oct 2016 |
31 Dec 2020 |
| Aubrey (Bill) Tobey |
Bill Tobey on his Bob Graham Award and Lessons Learned |
06 Dec 2006 |
31 Jul 2017 |
| B. Price |
Test Panel: B. Price, Philips on... Open Architecture |
29 Mar 2005 |
11 Aug 2017 |
| Barry Rapozo |
Barry Rapozo and his 2001 award |
29 Nov 2004 |
21 Oct 2019 |
| Bernie Meyerson |
When Simple IC Scaling Died |
05 Nov 2003 |
22 Aug 2017 |
| Bill (Aubrey) Tobey |
Bill Tobey on the Wafer Stepper and it's development at GCA |
13 Dec 2006 |
07 Sep 2017 |
| Bill Arnold |
Semiconductor lithography history: dateline 2003 - Bill Arnold |
22 Oct 2003 |
07 Sep 2017 |
| Bill Arnold |
Lithography Panel 2004: Bill Arnold |
16 Nov 2004 |
02 Mar 2018 |
| Bill Arnold |
Lithography Panel on Immersion vs. EUV at 32nm |
07 Dec 2005 |
08 Feb 2019 |
| Bill Arnold |
Lithography Panel 2006: Bill Arnold, ASML |
31 Oct 2006 |
01 Jan 2021 |
| Bill Arnold |
Lithography Panel 2007: Bill Arnold, ASML |
05 Nov 2007 |
13 Feb 2018 |
| Bill Arnold |
Lithography Panel 2008: Bill Arnold, ASML |
18 Nov 2008 |
20 Feb 2018 |
| Bill Arnold, Gene Fuller, ... |
Lithography Panel 2005: Audience Q&A on... 32nm: Immersion or EUV? |
07 Dec 2005 |
08 Feb 2019 |
| Bill Arnold, Gene Fuller, ... |
How is revenue recognized |
22 Oct 2003 |
07 Sep 2017 |
| Bill Arnold, Gene Fuller, ... |
Will a NGL emerge before EUV? |
22 Oct 2013 |
16 Aug 2017 |
| Bill Arnold, Gene Fuller, ... |
Semiconductor Lithography History: Dateline 2003 |
22 Oct 2003 |
07 Sep 2017 |
| Bill Arnold, Gene Fuller, ... |
Dateline 2003 - Highest NA and Lowest K possible |
22 Oct 2003 |
07 Sep 2017 |
| Bill Arnold, Gene Fuller, ... |
Lithography Panel 2004: Audience Q&A |
16 Nov 2004 |
02 Mar 2018 |
| Bill Holt |
Decision Making at Intel |
21 Jan 2008 |
05 Jul 2018 |
| Bob Dennard |
Power/Performance in ICs: Where the trend started |
15 Nov 1966 |
14 Nov 2019 |
| Bob Graham |
The Bob Graham Award |
29 Nov 2004 |
21 Oct 2019 |
| Bob Graham |
The stock will take care of itself |
15 Jun 1988 |
07 Feb 2021 |
| Bob Halliday |
The Role of CFO at a Semiconductor Equipment Company |
03 Sep 2005 |
22 Aug 2017 |
| Bob Helsel |
Semiconductor Test Consortium (STC) Panel 2008 |
05 Feb 2008 |
13 Feb 2018 |
| Bob Helsel, Don Edenfeld, ... |
How Industry Standards Improve Test Productivity |
22 Mar 2007 |
03 Oct 2017 |
| Boris Lipkin |
Managing a Turnaround in an Unfriendly Environment |
12 Oct 2004 |
11 Aug 2017 |
| Brian M. Krzanich |
Manufacturing at Intel |
24 Jun 2008 |
14 Feb 2018 |
| Chandra Mouli |
Intelligent Fab Automation |
21 Mar 2006 |
29 Aug 2017 |
| Chandra Mouli |
Enabling Intel’s R&D through Automated Manufacturing Technology |
08 Jan 2007 |
13 Feb 2018 |
| Charlie Sporck |
Fairchild & Chip Making |
10 Oct 2007 |
24 Jul 2017 |
| Charlie Sporck |
Going Off-Shore |
17 Oct 2007 |
31 Aug 2017 |
| Charlie Sporck |
Taking on the World |
24 Oct 2007 |
24 Jul 2017 |
| Charlie Sporck |
Lessons Learned |
31 Oct 2007 |
22 Oct 2019 |
| Chiang Yang |
Chiang Yang on What’s New in Photomask Technology |
18 Oct 2006 |
12 Feb 2018 |
| Craig Barrett |
Math, Science, & Your Future |
27 Apr 2006 |
24 Jul 2017 |
| Craig Barrett |
Craig Barrett: How Intel Rebuilt Manufacturing in the mid-80's |
04 May 2006 |
31 Jul 2017 |
| Craig Barrett |
American Competitiveness |
10 May 2006 |
31 Aug 2017 |
| D. Edenfeld |
Test Panel: D. Edenfeld, Intel on... Open Architecture |
29 Mar 2005 |
11 Aug 2017 |
| Dan Mahoney |
Renesas’ Amazing Strides in the SOC Systems Solution Market |
26 Oct 2006 |
21 Aug 2017 |
| Dan Maydan |
On the 20th Anniversary of Precision 5000 |
30 Nov 2007 |
22 Oct 2019 |
| Dan Maydan |
Building Applied Materials into a Multi-Product Company |
01 Dec 2005 |
31 Aug 2017 |
| Dan Maydan |
The Early Days of Applied Materials |
29 Nov 2005 |
24 Jul 2017 |
| Dan Maydan |
Lessons Learned at Applied Materials |
12 Dec 2005 |
24 Jul 2017 |
| Dave Anderson |
What ATDF’s All About |
07 Sep 2006 |
21 Aug 2017 |
| Dave Markle |
The Projection Aligner: It's development at Perkin Elmer in the 1970's |
16 Aug 2007 |
22 Oct 2019 |
| Dick Deininger |
Dick Deininger on Advanced Process Control |
22 Apr 2003 |
08 May 2018 |
| Dick Deininger |
Where is APC used? |
22 Apr 2003 |
05 Apr 2018 |
| Dick Deininger |
Joint Process Development with IBM |
22 Apr 2003 |
05 Apr 2018 |
| Don Edenfeld |
Semiconductor Test Consortium (STC) Panel 2008: Don Edenfeld, Intel |
05 Feb 2008 |
13 Feb 2018 |
| Don Edenfeld, Klaus Luther ... |
Semiconductor Test Consortium (STC) Panel 2008: Q & A |
05 Feb 2008 |
13 Feb 2018 |
| Ed Segal |
2002: Ed Segal | The Chip History Center |
29 Nov 2004 |
21 Oct 2019 |
| Edmund Cheng |
Design-For-Manufacturing (DFM) |
26 Aug 2004 |
11 Aug 2017 |
| F. Bode |
Test Panel: F. Bode, Bode Enterprises on... Open Architecture |
29 Mar 2005 |
11 Aug 2017 |
| F. Bode, D. Edenfeld, B. P ... |
Test Panel: Audience Q&A on... Open Architecture |
29 Mar 2005 |
21 Aug 2017 |
| G. Dan Hutcheson |
Moore's Law and the race to the bottom by G. Dan Hutcheson |
15 Nov 2006 |
02 Oct 2017 |
| G. Dan Hutcheson |
The Shifting Winds of Power |
30 Apr 2008 |
14 Feb 2018 |
| Gary Heerssen |
Remembering a Manufacturing Hero |
13 Jun 2007 |
31 Jul 2017 |
| Gary Patton |
IBM’s 32nm Hi-K Chip Technolog |
23 Apr 2008 |
14 Feb 2018 |
| Gene Fuller |
Semiconductor lithography history: dateline 2003 - Gene Fuller |
22 Oct 2003 |
07 Sep 2017 |
| Gene Fuller |
Lithography Panel 2004: Gene Fuller |
16 Nov 2004 |
02 Mar 2018 |
| Gene Fuller |
Lithography Panel: Gene Fuller of Nikon on Immersion vs. EUV at 32nm |
07 Dec 2005 |
08 Feb 2019 |
| Gene Fuller |
Lithography Panel 2006: Gene Fuller, Nikon |
21 Dec 2016 |
07 Sep 2017 |
| Gene Fuller |
Lithography Panel 2007: Gene Fuller, Nikon |
05 Nov 2007 |
13 Feb 2018 |
| Gene Fuller, Phil Ware, Bi ... |
Semiconductor lithography history: dateline 2003 -193nm Immersion |
22 Oct 2003 |
07 Sep 2017 |
| Gene Fuller, Phil Ware, Bi ... |
Semiconductor lithography history: dateline 2003 - Design rules |
22 Oct 2003 |
07 Sep 2017 |
| Gene Fuller, Phil Ware, Bi ... |
Lithography Panel 2007: Audience Q&A |
05 Nov 2007 |
13 Feb 2018 |
| Hans Stork on customer inv ... |
The rise of customer involvement |
18 Jul 2003 |
03 Oct 2018 |
| Hans Stork on decision-mak ... |
Decision-making processes in a technology development organization |
18 Jul 2003 |
02 Oct 2018 |
| Hans Stork on Low-k Interc ... |
Low-k Interconnect Materials in the Early 2000’s |
18 Jul 2003 |
02 Oct 2018 |
| Hans Stork on photonics an ... |
Photonics and optical interconnects in the early 2000s |
18 Jul 2003 |
02 Oct 2018 |
| Hans Stork on the role for ... |
The role for E-beam maskless lithography |
18 Jul 2003 |
02 Oct 2018 |
| Haruo Matsuno |
Remembering Haruo Matsuno of Advantest |
24 Oct 2014 |
07 May 2021 |
| Henry Becker |
Introducing Qimonda and Defining Their Competitive Edge |
10 May 2007 |
03 Oct 2017 |
| Jack Trautman |
Is Test Adding More Value than Wafer Fab Today? |
18 Nov 2003 |
21 Sep 2017 |
| Jack Trautman |
Audience Q&A | The Chip History Center |
18 Nov 2003 |
17 Aug 2017 |
| Jerry Cutini |
The Opportunity for Mid-Tier Semi Eq Cos. |
31 Jan 2006 |
21 Aug 2017 |
| Jerry Hutcheson |
Jerry Hutcheson and his 2002 award for Sales and Marketing |
29 Nov 2004 |
21 Oct 2019 |
| Jim Bowen |
Eaton's Semiconductor Equipment Foray, a case study |
25 Oct 2006 |
31 Jul 2017 |
| Jim Bowen |
The Turn Around at Fairchild Test Systems Group |
05 Jan 2006 |
31 Jul 2017 |
| Jim Bowen |
Building Fairchild Test Systems Group into a Global Giant |
12 Jan 2006 |
31 Jul 2017 |
| Jim Bowen |
Lessons Learned at Fairchild Test Systems Group |
18 Jan 2006 |
31 Jul 2017 |
| Jim Healy |
Jim Healy and his 2001 award for Sales and Marketing |
29 Nov 2004 |
21 Oct 2019 |
| Jim Healy |
Latest Trends in Design For Test |
15 Mar 2007 |
03 Oct 2017 |
| Jim Morgan |
Bringing Focus to AMAT |
07 Mar 2006 |
31 Jul 2017 |
| Jim Morgan |
Building a Global Position |
16 Mar 2006 |
31 Jul 2017 |
| Jim Morgan |
Keys to Success |
23 Mar 2006 |
31 Jul 2017 |
| John Bardeen |
John Bardeen and Transistor Physics |
25 Apr 2007 |
24 Jul 2017 |
| Kazuo Ushida |
Advancing Nano-Lithography |
14 Jul 2008 |
14 Feb 2018 |
| Keith Lee |
Advantest Addresses Challenges of the ATE Business |
24 May 2005 |
21 Aug 2017 |
| Keith Lee |
Advantest's strategies during the downturn |
30 Jun 2009 |
14 Feb 2018 |
| Keith Lee | The Chip Histo ... |
Audience Q&A |
24 May 2005 |
21 Aug 2017 |
| Ken David |
The First Hi-k Dielectric Materials for ICs |
27 Oct 2003 |
22 Aug 2017 |
| Ken Schroeder |
Ken Schroeder | The Chip History Center |
15 Jun 2004 |
02 Feb 2018 |
| Ken Schroeder |
A tribute to Ken Schroeder |
21 Nov 2016 |
31 Dec 2020 |
| Kenneth L. Schroeder |
How KLA-Tencor Meets Stringent Process Control Requirements |
11 Jul 2005 |
26 Jan 2018 |
| Klaus Luther |
Semiconductor Test Consortium (STC) Panel 2008: Klaus Luther, Infineon |
05 Feb 2008 |
13 Feb 2018 |
| Kumud Srinivasan |
Kumud Srinivasan on Fab Automation at Intel |
04 Jun 2004 |
12 Feb 2018 |
| Lisa Su |
Lisa Su | The Chip History Center |
14 Dec 2006 |
02 Feb 2018 |
| Mark Bohr |
Intel at 90nm | The Chip History Center |
09 Dec 2002 |
27 Apr 2018 |
| Mark Bohr |
Intel at 65nm | The Chip History Center |
20 Nov 2003 |
28 Sep 2017 |
| Mark Bohr |
Intel moves 65nm to manufacturing |
24 Oct 2005 |
28 Sep 2017 |
| Mark Bohr |
Hi-k and Metal Gates |
02 Feb 2007 |
03 Oct 2017 |
| Mark Bohr |
The State of Process Development at Intel-32nm, 22nm |
09 Mar 2009 |
14 Feb 2018 |
| Mark Jagiela |
Open ATE Architectures versus Multiple Test Platforms |
12 Aug 2003 |
22 Aug 2017 |
| Mark Jagiela |
The Move to an Open Architecture in Semiconductor IC Testing |
12 Aug 2003 |
22 Aug 2017 |
| Mark Jagiela |
Is it possible to have a non-partisan consortium? |
12 Aug 2003 |
22 Aug 2017 |
| Mark Jagiela |
Teradyne joining consortium? |
12 Aug 2003 |
10 Aug 2017 |
| Mark Jagiela |
Consolidation in the ATE Industry |
12 Aug 2003 |
22 Aug 2017 |
| Martin van den Brink |
The Rise of ASML |
26 Jul 2006 |
31 Jul 2017 |
| Martin van den Brink |
Martin van den Brink |
10 Jul 2006 |
02 Feb 2018 |
| Michael Polcari |
What's New at SEMATECH? |
28 Sep 2004 |
11 Aug 2017 |
| Mick Fukuda |
Lithography Panel: Mick Fukuda of Canon on Immersion vs. EUV at 32nm |
07 Dec 2005 |
08 Feb 2019 |
| Mihir Parikh |
Mihir on the History of Automation in the Semiconductor Industry |
13 Aug 2008 |
22 Oct 2019 |
| Mihir Parikh |
Lessons Learned |
21 Aug 2008 |
22 Oct 2019 |
| Mike Goldstein & Daisuke O ... |
First 450mm Wafer from Nippon Mining & Metals |
23 Jan 2008 |
12 Feb 2018 |
| Mike Mayberry |
On Test | The Chip History Center |
08 May 2006 |
21 Aug 2017 |
| Mike Mayberry |
What’s New in Components Research at Intel |
15 May 2006 |
21 Aug 2017 |
| Mike Polcari |
Current Trends in Semiconductor Research |
25 Apr 2007 |
03 Oct 2017 |
| Mike Splinter |
AMAT: One Year After |
08 Jun 2004 |
10 Aug 2017 |
| Mike Splinter |
Audience Q&A | The Chip History Center |
08 Jun 2004 |
17 Aug 2017 |
| Mike Splinter |
What's New at Applied Materials? |
05 May 2005 |
11 Aug 2017 |
| Mike Splinter |
New Plays in Materials, Patterning, and Tools for Solar Cells |
14 Sep 2006 |
21 Aug 2017 |
| Nasser Grayeli |
Finding Competitive Advantage in Packaging |
05 Dec 2008 |
14 Feb 2018 |
| Nat Cieglio |
Nat Ceglio: EUV Pioneer |
01 Jan 1988 |
07 Sep 2017 |
| Nicholas DeWolf |
The Father of ATE (Automatic Test Equipment) |
15 Jul 2017 |
02 Dec 2019 |
| Nick Konidaris |
Laser Repair | The Chip History Center |
16 Jul 2004 |
11 Aug 2017 |
| Nick Konidaris |
New Systems Keep ESI at the Lead in Laser Repair |
12 Jan 2006 |
21 Aug 2017 |
| P. Roddy |
Test Panel: P. Roddy, Freescale on... Open Architecture |
29 Mar 2005 |
11 Aug 2017 |
| Paul Magliocco |
Paul Magliocco: New Reality for Test |
18 Jun 2003 |
08 May 2018 |
| Paul Magliocco |
Paul Magliocco: Structural vs Functional Test |
18 Jun 2003 |
23 Mar 2018 |
| Paul Magliocco |
Open ATE Architecture: ATE Executive View |
18 Jun 2003 |
23 Mar 2018 |
| Paul Otellini |
Tribute to Paul Otellini |
02 Oct 2017 |
02 Aug 2018 |
| Peo Hansson |
Performance Improvements in Semiconductors |
14 May 2008 |
14 Feb 2018 |
| Peter Rose |
Peter Rose: Father of Ion Implantation |
29 Nov 2004 |
31 Jul 2017 |
| Phil Ware |
Semiconductor lithography history: dateline 2003 - Phil Ware |
22 Oct 2003 |
07 Sep 2017 |
| Phil Ware |
Lithography Panel 2004: Phil Ware |
16 Nov 2004 |
02 Mar 2018 |
| Phil Ware |
Lithography Panel 2006: Phil Ware, Canon |
21 Dec 2006 |
07 Sep 2017 |
| Phil Ware |
Lithography Panel 2007: Phil Ware, Canon |
05 Nov 2007 |
13 Feb 2018 |
| Phil Ware |
Lithography Panel 2008: Phil Ware, Canon |
18 Nov 2008 |
20 Feb 2018 |
| Phil Ware, Bill Arnold, Ge ... |
Lithography Panel 2006: Audience Q&A |
31 Oct 2006 |
01 Jan 2021 |
| Ray Thompson |
How has the industry changed, what's different and why? |
06 May 2004 |
11 Aug 2017 |
| Rick Wallace |
KLA-Tencor and Accelerating the 45nm Yield Ramp |
10 Jul 2007 |
03 Oct 2017 |
| Robert N. Noyce |
Reflections on the Wisdom and Vision of Bob Noyce |
13 Apr 2006 |
31 Jul 2017 |
| Robert N. Noyce |
Robert N. Noyce: Leslie Berlins Biography - Segment 1 |
20 Jun 2007 |
22 Oct 2019 |
| Robert N. Noyce |
Robert N. Noyce: Leslie Berlin's Biography - Segment 2 |
27 Jun 2007 |
22 Oct 2019 |
| Robert N. Noyce |
Legends, Circa 1990 - Remembering Robert Noyce |
11 Jun 2008 |
31 Jul 2017 |
| Robert N. Noyce |
Robert N. Noyce: Early Career |
01 Jun 1953 |
01 Aug 2017 |
| Robert N. Noyce |
Robert N. Noyce: The Intel Years |
01 Jun 1968 |
01 Aug 2017 |
| Scott Kulicke |
Assembly & Packaging Challenges |
04 Mar 2004 |
14 Sep 2017 |
| Sean Maloney |
Dynamic Duo | The Chip History Center |
15 Jun 2006 |
21 Aug 2017 |
| Steve Longoria |
IBM Microelectronics’ Common Platform: a new business model |
30 May 2007 |
03 Oct 2017 |
| Steve Nakayama |
2003: Steve Nakayama |
29 Nov 2004 |
21 Oct 2019 |
| Steve Wigley |
Semiconductor Test Consortium (STC) Panel 2008: Steve Wigley, LTX |
05 Feb 2008 |
13 Feb 2018 |
| Sunit Rikhi |
Design For Manufacturing (DFM) |
26 Sep 2006 |
07 Sep 2017 |
| Sunit Rikhi |
Extreme DFM at Intel |
19 Feb 2008 |
13 Feb 2018 |
| Sunlin Chou |
Intel's R&D Pipeline |
05 Oct 2004 |
08 May 2018 |
| Sunlin Chou |
How Power, Performance, Area, and Cost relate to Moore's Law |
05 Oct 2004 |
31 Oct 2019 |
| Sunlin Chou: A tribute |
Sunlin Chou: A tribute |
05 Dec 2018 |
31 Dec 2020 |
| Thomas Sonderman |
Tom Sonderman on Automated Precision Manufacturing |
29 Mar 2004 |
08 May 2018 |
| Tom Caulfield |
Memory and Logic Divergence & its Impact on IC Equipment |
23 Jul 2008 |
14 Feb 2018 |
| Tom Franz |
Intel’s Manufacturing Pipeline |
25 Jul 2007 |
13 Feb 2018 |
| Toshio Maruyama |
Advantest: What made it a Successful Company |
05 Jan 2006 |
23 May 2019 |
| Wilf Corrigan |
The Lessons He Learned and Why Fundamentals are Important |
30 May 2007 |
22 Oct 2019 |
| Wilf Corrigan |
The Development of the ASIC Industry |
24 May 2007 |
22 Oct 2019 |
| Wilf Corrigan |
How the SIA Got Started |
16 May 2007 |
23 Mar 2018 |
| William Holt |
Striking Balance Between Manufacturing Costs & Design Features |
07 Feb 2006 |
08 Feb 2019 |
| Yan Borodovsky |
Yan Borodovsky on DFM and Computational Lithography |
13 Sep 2007 |
12 Feb 2018 |
| Yan Borodovsky |
Yan Borodovsky with a demonstration of Computational Lithography |
19 Sep 2007 |
12 Feb 2018 |